Characterization methods
- outdoor stage
for long time monitoring of cells and modules in real operational conditions
- sheet resistance
measurement - contactless and four point probe scanner
- MW PCD, QSSPC
(minority carrier lifetime measurement)
- solar simulators
for the measurement of solar cells and modules
- contactless measurement of substrate thickness
- digital optical
microscopy (Deep-focus setup)
- scanning probe microscopy (SPM)
- light
degradation setup for solar cells (LID)
- Reimer technique
for resistance measurement
- LBIC scanner (mapping
of local currents)
- surface energy
evaluation system (SeeSystem)
- EL/FL -
(electro- and photo-luminescence)
- resistivity
measurement - four point probe scanner and contactless probe
- dynamic testing
of solar cell structures
- EQE and R/T
measurement
- spectroscopic
analysis
- thermography
- elipsometry
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