Characterization methods
- outdoor stage for long time monitoring of cells and modules in real operational conditions
- sheet resistance measurement - contactless and four point probe scanner
- MW PCD, QSSPC (minority carrier lifetime measurement)
- solar simulators for the measurement of solar cells and modules
- contactless measurement of substrate thickness
- digital optical microscopy (Deep-focus setup)
- scanning probe microscopy (SPM)
- light degradation setup for solar cells (LID)
- Reimer technique for resistance measurement
- LBIC scanner (mapping of local currents)
- surface energy evaluation system (SeeSystem)
- EL/FL - (electro- and photo-luminescence)
- resistivity measurement - four point probe scanner and contactless probe
- dynamic testing of solar cell structures
- EQE and R/T measurement
- spectroscopic analysis
- thermography
- elipsometry
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